scanning surface potential microscopy

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• Scanning probe microscopy — Part of a series of articles on Nanotechnology …   Wikipedia

• Scanning tunneling spectroscopy — (STS) is a powerful experimental technique in scanning tunneling microscopy (STM) that uses a scanning tunneling microscope (STM) to probe the local density of electronic states (LDOS) and band gap of surfaces and materials on surfaces at the… …   Wikipedia

• Scanning voltage microscopy — (SVM) sometimes also called nanopotentiometry is a scientific experimental technique based on atomic force microscopy. A conductive probe, usually only a few nanometers wide at the tip, is placed in full contact with an operational electronic or… …   Wikipedia

• Scanning tunneling microscope — Image of reconstruction on a clean Gold(100) surface …   Wikipedia

• Surface diffusion — [ adatom diffusing across a square surface lattice. Note the frequency of vibration of the adatom is greater than the jump rate to nearby sites. Also, the model displays examples of both nearest neighbor jumps (straight) and next nearest neighbor …   Wikipedia

• Photoconductive atomic force microscopy — (pc AFM) is a scientific technique.. Multi layer photovoltaic cells have gained popularity since mid 1980s.[1] At the time, research was primarily focused on single layer photovoltaic (PV) devices between two electrodes, in which PV properties… …   Wikipedia

• Transmission electron microscopy — A TEM image of the polio virus. The polio virus is 30 nm in size.[1] Transmission electron microscopy (TEM) is a microscopy technique whereby a beam of electrons is transmitted through an ultra thin specimen, interacting with the specimen as it… …   Wikipedia

• Conductive atomic force microscopy — (C AFM) is a variation of atomic force microscopy (AFM) and scanning tunneling microscopy (STM), which uses electrical current to construct the surface profile of the studied sample. The current is flowing through the metal coated tip of the… …   Wikipedia

• Environmental scanning electron microscope — Wool fibers imaged in an ESEM by the use of two symmetrical plastic scintillating backscattered electron detectors …   Wikipedia

• Chemical force microscopy — Figure 1: Photograph of an AFM system which can be used for chemical force microscopy. Chemical force microscopy (CFM) is a variation of atomic force microscopy (AFM) which has become a versatile tool for characterization of materials surfaces.… …   Wikipedia

• microscope — /muy kreuh skohp /, n. 1. an optical instrument having a magnifying lens or a combination of lenses for inspecting objects too small to be seen or too small to be seen distinctly and in detail by the unaided eye. 2. (cap.) Astron. the… …   Universalium